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Book Cover for: High-Z Materials for X-Ray Detection: Material Properties and Characterization Techniques, Leonardo Abbene

High-Z Materials for X-Ray Detection: Material Properties and Characterization Techniques

Leonardo Abbene

This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.

Book Details

  • Publisher: Springer
  • Publish Date: Jan 16th, 2024
  • Pages: 246
  • Language: English
  • Edition: 2023 -
  • Dimensions: 9.21in - 6.14in - 0.54in - 0.81lb
  • EAN: 9783031209574
  • Categories: Electronics - Circuits - GeneralMicrowavesMaterials Science - General

About the Author

Leonardo Abbene is Associate Professor in Applied Physics in the Department of Physics and Chemistry Emilio Segrè at University of Palermo, Italy. His research activities are mainly focused on the development and characterization of room temperature semiconductor radiation detectors (CdTe, CZT) and digital electronics for X-ray and gamma ray spectroscopy and imaging. He was the principal investigator (PI) of several research projects, where innovative instrumentation has been developed for medical (mammography, computed tomography, BNCT) and astrophysical (focal plane detectors for X-ray telescopes) applications. He is author or co-author of over 80 research papers in international journals and conferences. He is a frequent invited speaker and served as chairman for international conferences. Prof. Abbene is reviewer and editorial board member for several international journals. In his free time, Leonardo likes to play tennis and fish in the Mediterranean Sea of the beautiful Sicily.

Krzysztof (Kris) Iniewski is a director of detector architecture and applications at Redlen Technologies Inc., a detector company based in British Columbia, Canada owned by Canon Inc in Japan. During his tenure at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.

Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 25+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.

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